Please use this identifier to cite or link to this item: https://idr.l4.nitk.ac.in/jspui/handle/123456789/11763
Title: Investigation of hole transport in ?-NPD using impedance spectroscopy with F4TCNQ as hole-injection layer
Authors: Fernandes, J.M.
Kiran, M.R.
Ulla, H.
Satyanarayan, M.N.
Umesh, G.
Issue Date: 2015
Citation: Superlattices and Microstructures, 2015, Vol.83, , pp.766-775
Abstract: The charge carrier transport is studied in N,N?-di(1-naphthyl)-N,N?-diphenyl-(1,1?-biphenyl)-4,4?-diamine (?-NPD) with the incorporation of sequentially doped p-type dopant 2,3,5,6-tetrafluoro-7,7,8,8-tetracyanoquinodimethane (F4TCNQ) as hole-injection layer in hole-only device structures. The field dependent mobility of the charge carriers is determined using frequency dependent capacitance, conductance and impedance methods by varying the thickness of ?-NPD. The Poole-Frenkel zero-field mobility and the Poole-Frenkel coefficient thus obtained for each device in all the three methods is found to be almost constant. 2015 Elsevier Ltd. All rights reserved.
URI: http://idr.nitk.ac.in/jspui/handle/123456789/11763
Appears in Collections:1. Journal Articles

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